Above images are Multi Crystal Silicon to be visualized with MAP series. Recognize the difference efficiency area in a cell ( Green Area : Lower Jsc/Orange : Higher Jsc) 　 Compared to EL method, it is capable to make the measurement which is closer to Real efficiency ratio with directly irradiating light source bundle by passing Xenon light as light source through AM filter Compared to LBIC with laser spot method, with line beam for irradiation illumination, it becomes possible very shorter measurement. With original unique optical design, it becomes possible by easily selecting the best light source and wavelength. Also, by capturing current density distribution at different bias in plural times, it is possible to measure I-V curve and Pmax distribution and dark current etc and also extract easily shunt area and individual defects by composing images at different bias.